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Takuma Kobayashi

Osaka University / JP

Osaka University

Engagements

10/10/2022

Poster Presentation
PP 035
Evaluation of hole trap density at SiO₂/GaN MOS interfaces through capacitance-voltage measurements under ultraviolet light illumination
Characterization, Electronic devices

12/10/2022

15:00 – 15:15 12 Min. 3 Min.
Abstract Talk
AT 158
Control of oxidation and reduction reactions at SiO₂/GaN interfaces towards high performance and reliability GaN MOSFETs
Characterization, Electronic devices