Microscopy Conference 2025

High-resolution electron microscopy for the design and scalability of neuromorphic quantum photonics

MS 4: Low-dimensional and quantum materials

MS 4

Low-dimensional materials can exhibit unique properties shaped by quantum mechanical effects, which may arise from reduced dimensionality and/or exotic electronic structures. State-of-the-art techniques and novel methods of data evaluation in atomic-resolution electron microscopy and spectroscopy provide insights into the intricate relationship between atomic structure and quantum phenomena. The session is dedicated to report on recent advances in this field.

Low-dimensional and quantum materials

Abstract talk

IM 1: Progress in instrumentation and ultrafast EM

IM 1

Backscattered electron energy loss spectroscopy – Analytical SEM imaging at sub-nanometer resolution

IM 3: SEM and FIB developments

IM 3

This session provides a platform for Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) users and enthusiasts. The aim is to share and exchange insights on new applications and advanced methodologies, and to discuss instrumental aspects as well as challenges related to signal generation and interpretation.We invite contributions focusing on the use of new instrumentation, from commercial to custom-designed solutions, as well as uncommon and creative applications of standard tools. Topics of interest range from means of signal generation, detection, and interpretation to the use of uncommon ion species and precursors for gas injection systems and novel means of sample preparation, modification, and manipulation.

SEM and FIB developments

IM 2: Advanced spectroscopy

IM 2

Chemical distribution of highly similar functional polymers from low-loss EELS signals and machine learning

MS 5: Functional organics, carbon-based and hybrid materials

MS 5

In this session, we highlight recent achievements in developing approaches and protocols for the analysis of functional organics, materials with hybrid soft-hard interfaces, as well as other electron beam-sensitive structures. We welcome abstracts addressing:(1) advances in microscopy approaches for correlative and in-situ investigations of soft materials(2) sample preparation workflows which help to preserve the native state of these samples (cryo-preparation methods, air-free transfer, etc.)(3) working at limited doses, as well as data science challenges for low signal-to-noise images and spectra(4) contrast enhancement methods for soft and hybrid materials; (5) low-voltage electron microscopy solutions

Functional organics, carbon-based and hybrid materials

The EM glossary – A community resource providing harmonised terminology in electron microscopy

IM 6: Big data and AI techniques

IM 6

Poster session: IM 6/LS 7: Big data and AI techniques

Poster

Ultrastructural analysis of hydrogels – Avoiding the macropore trap

Poster session: MS 5: Functional organics, carbon-based and hybrid materials

LS 6: Advances in sample preparation

LS 6

Beam sensitive materials present significant challenges in both sample preparation and the actual microscopy using our electron and ion beam instruments. However, damage is not a straight forward and uniform process: Proteins degrade differently under high-energy electron exposure than battery materials do when exposed to air during sample preparation, handling and transfer. Additionally, interactions between the electron beam and residual hydrocarbons in the vacuum chamber can lead to undesired carbon contamination in the area being analyzed. At the same time, similar critical preparation techniques – such as ultramicrotome sectioning or ion beam milling – are used across different materials, but with necessary adoptions to suit each specific material. This workshop will give an overview of different preparation techniques, sample transfer approaches, and strategies to minimize beam damage, offering insights into data collection across various scientific fields. These will cover biomedical samples and polymers, including their cryo-preparation and microscopy, as well as inert gas workflows for handling sensitive material samples. We will discuss various types of damage, including well-known degradation processes and chemical reactions, as well as possible ways to prevent or minimize them. This workshop aims to bring together electron microscopists from materials and life sciences to learn from each other, exchange knowledge, share best practices, and explore new approaches for studying complex next-generation materials and their intricate microscopy, such as in-situ experiments.

conference room 2

Part IV

Materials meets life science microscopy – From critical preparation to advanced microscopy of sensitive/reactive specimens

Prof. Dr. Rasmus R. Schröder

Einsätze

31.08.2025