Beschreibung
Correlative microscopy aims at a combination of different imaging modalities to analyze a single specimen by more than one microscopic technique. Recent developments in microscopy as well as in computational approaches make it more and more feasible to combine different imaging modalities in a correlative and multimodal way. Therefore, this session will focus not only on the ‘classic combination’ of light and electron microscopy but will cover also other approaches that include X-ray, Raman- or atomic force microscopy (AFM). It is also aimed to report on new computational approaches, such as machine learning to analyze the obtained CLEM data.