PS 16
Poster session IM 5: Quantitative image and diffraction data analysis

Programm

• • Poster
  • IM5.P001

  Including inelastic plasmon scattering in multislice simulations for STEM: a real space integration scheme

  • Florian Fritz Krause (Bremen / DE)

   IM 5: Quantitative image and diffraction data analysis
• • Poster
  • IM5.P002

  Dose-efficient acquisition of EDX-maps: a proposal for an adaptive scanning scheme

  • Florian Fritz Krause (Bremen / DE)

   IM 2: Spectroscopy, IM 5: Quantitative image and diffraction data analysis
• • Poster
  • IM5.P003

  Analysing gold nanorod STEM-in-SEM signals at 20 and 30 keV beam energies using a simulation combining explicite diffraction calculations with Monte Carlo strategies

  • Dorothee Hüser (Braunschweig / DE)

   IM 3: SEM and FIB developments, IM 5: Quantitative image and diffraction data analysis
• • Poster
  • IM5.P004

  Measurement of electron dose in TEM mode at a JEOL TEM/STEM JEM 2200FS

  • Holm Kirmse (Berlin / DE)

   IM 1: Progress in instrumentation and ultrafast EM, IM 5: Quantitative image and diffraction data analysis
• • Poster
  • IM5.P005

  TEM characterization of amorphous molecular clusters for directional white-light generation

  • Jürgen Belz (Marburg / DE)

   IM 2: Spectroscopy, IM 5: Quantitative image and diffraction data analysis
• • Poster
  • IM5.P006

  The effect of muffin-tin radii on potentials used for multislice simulations

  • Christian Bick (Braunschweig / DE)

   IM 5: Quantitative image and diffraction data analysis
• • Poster
  • IM5.P007

  Contribution of strain and relaxation to dynamical diffraction in 4D-STEM signals

  • Frederik Otto (Berlin / DE)

   IM 5: Quantitative image and diffraction data analysis, MS 3: Low-dimensional and quantum materials
• • Poster
  • IM5.P008

  Enhancing relative aberration measurements in the TEM by PCTF-corrected cross-correlation

  • Martin Linck (Heidelberg / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM5.P009

  Deep learning pipeline for statistical quantification of amorphous two-dimensional materials and dynamic tracking

  • Christopher Leist (Ulm / DE)

   IM 5: Quantitative image and diffraction data analysis, MS 3: Low-dimensional and quantum materials
• • Poster
  • IM5.P0010

  Investigation of the impact of multiple plasmon-loss on low-angle electron diffraction by energy-filtered 4D-STEM

  • Hoel Laurent Robert (Jülich / DE)

   IM 2: Spectroscopy, IM 5: Quantitative image and diffraction data analysis
• • Poster
  • IM5.P0011

  A semiconductor-type segmented STEM annular dark-field detector

  • Pirmin Kükelhan (Heidelberg / DE)

   IM 1: Progress in instrumentation and ultrafast EM, IM 5: Quantitative image and diffraction data analysis
• • Poster
  • IM5.P0012

  Change of basis: a compression method for ptychography

  • Anton Gladyshev (Berlin / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM5.P0013

  Second moment STEM tomography

  • Sebastian Sturm (Munich / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM5.P0014

  Procedure for 3D atomic resolution reconstructions using atom-counting and a Bayesian genetic algorithm

  • Annick De Backer (Antwerp / BE)

   IM 5: Quantitative image and diffraction data analysis, MS 1: Energy-related materials and catalysts
• • Poster
  • IM5.P0015

  Increasing the spatial resolution of pixelated semiconductor tracking detectors using convolutional neural networks

  • Björn Eckert (Munich / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM5.P0016

  TEM data compression and denoising by autoencoders and convolutional neural networks

  • Sergii Pylypenko (Dresden / DE)

   IM 5: Quantitative image and diffraction data analysis, LS 4: Image analysis of large data sets
• • Poster
  • IM5.P0017

  Investigating the influence of reconstruction and segmentation algorithms on the volume reconstruction in electron tomography

  • Tobias Krekeler (Hamburg / DE)

   IM 5: Quantitative image and diffraction data analysis, MS 1: Energy-related materials and catalysts
• • Poster
  • IM5.P0018

  Quantitative field mapping around electrically biased needles by STEM & holography

  • Jean Felix Dushimineza (Jülich / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM5.P0019

  Quantitative imaging of single cesium atoms in the channels of a Beryl crystal

  • Daniel Knez (Graz / AT)

   IM 5: Quantitative image and diffraction data analysis, MS 3: Low-dimensional and quantum materials
• • Poster
  • IM5.P0020

  Atom-counting from multiple ADF STEM images

  • Duygu Gizem Sentürk (Antwerp / BE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM5.P0021

  Dynamic range compression in iDPC imaging enables visualisation of light atoms closely surrounded by heavy elements

  • Penghan Lu (Jülich / DE)

   IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
• • Poster
  • IM5.P0022

  Do we really need to see the atoms?

  • Marek Petrik (Marburg / DE)

   IM 5: Quantitative image and diffraction data analysis, LS 4: Image analysis of large data sets