Heiko Müller (Heidelberg / DE), Giulio Guzzinati (Heidelberg / DE), Martin Linck (Heidelberg / DE), Pirmin Kükelhan (Heidelberg / DE), Dominique Lörks (Heidelberg / DE), Angelika Leibscher (Heidelberg / DE), Ingo Maßmann (Heidelberg / DE), Volker Gerheim (Heidelberg / DE)
Abstract text (incl. figure legends and references)
Recent developments of detector technologies and acquisition schemes cause a demand for modular post-column energy filters with good performance for EFTEM and EELS experiments. Owing to decades of research in academia and at Gatan company for post-column filters and at Zeiss and JEOL companies for in-column filters these techniques are well established [1,2]. At CEOS we re-investigated the optical design and technology and identified some incremental improvements by using design methods, manufacturing technologies and alignment strategies originally developed for aberration correctors. Complementary to established plug-and-play solutions which primarily allow for a predefined combination of microscope / spectrometer / detector, we provide an open platform with utmost freedom in the selection of components, regarding both hardware and software.
The optics design of the CEOS Energy-Filtering and Imaging Device (CEFID) is based on a highly optimized sector magnet combined with two 12-pole elements. For all other focusing elements we use pure quadrupoles supplemented by some deflectors and separate two- and three-fold stigmators. This approach already allows for a 12mm entrance aperture with a peak-to-peak non-isochromaticity below 1eV at 200kV (Fig. 1) and a root-mean-square geometric distortion below 0.35% in imaging mode. In spectroscopy mode dispersions from 1meV/channel up to 1eV/channel are possible even at 80kV. The use of well-designed quadrupole elements made from high-quality soft iron helps to largely avoid remanence effects and improves the reproducibility of alignments. The filter design introduces a clear separation between pre- and post-slit alignments. All second- and higher-order spectrum aberrations can be measured and tuned at the slit plane by using identical methods for EFTEM and EELS modes [3]. This simplifies operation and enables to switch between imaging and spectroscopy modes with different dispersions or even different detectors with no or only little re-tuning. With an entrance aperture of 5 mm an energy resolution in the sub-20meV range should be possible and a drift of less than 1eV over 12 hours at 300 kV has been achieved.
Multiple pixelated detectors can be added at different distance from the final cross-over, e.g. large-field of view scintillator-coupled or direct-detection CMOS cameras or frame- or event-based hybrid-pixel detectors with a large pixel size (Fig. 2). Our Python-based software targets for open interfaces and flexibility for user-scripting also for unusual experimental setups. EFTEM and EELS including STEM spectrum imaging are readily possible [4].
References:
[1] Reimer, L. (1995) Energy-filtering transmission electron microscopy. Springer, Berlin.
[2] Egerton, R. F. (2011) Electron energy-loss spectroscopy in the electron microscope. Springer, Berlin.
[3] F. Kahl et al. (2019) AIEP 212 including Proceedings CPO-10.
[4] A. Ruiz-Caridad et al. (2022) Micron 160, Volume 160.
<Fig1>
Figure1. Non-isochromaticity measured at 200kV for the full Ø12mm entrance aperture and the inner Ø8mm area with increased post-filter magnification.
<Fig2>
Figure 2. CAD Model with a selection of currently possible pre-filter and post-filter detectors. Typically only two post-filter detectors are installed on the same system.
Auf unserem Internetauftritt verwenden wir Cookies. Bei Cookies handelt es sich um kleine (Text-)Dateien, die auf Ihrem Endgerät (z.B. Smartphone, Notebook, Tablet, PC) angelegt und gespeichert werden. Einige dieser Cookies sind technisch notwendig um die Webseite zu betreiben, andere Cookies dienen dazu die Funktionalität der Webseite zu erweitern oder zu Marketingzwecken. Abgesehen von den technisch notwendigen Cookies, steht es Ihnen frei Cookies beim Besuch unserer Webseite zuzulassen oder nicht.