Poster zum Thema "Poster session IM 3: SEM and FIB developments"

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  • IM3.P001
Characterisation of a timepix detector for use in SEM acceleration voltage range
  • Nikita Denisov (Antwerp / BE)
  • IM3.P002
A novel ion source for Lithium-ion microscopy and 3D tomography
  • IM3.P003
Multi-voltage FIB-tomography of the hierarchical nanoporous gold
  • IM3.P004
Implementation of elastic and inelastic scattering processes for electrons with energies below 30 keV in Geant4 for the simulation of SEM
  • IM3.P005
Video frame interpolation neural network for FIB-SEM tomography
  • IM3.P006
Traceable size measurement of polysterene particles with sizes up to 500 nm using STEM-in-SEM together with simulation-based image analysis
  • IM3.P007
JEOL`s JSM-IT800 series: high performance SEM for all users
  • IM3.P008
Advanced focused ion beam milling techniques for TEM specimen preparation of solid bulk samples
  • IM3.P009
TEM sample preparation with high-energy Xenon ions and focused low-energy Argon by plasma FIB
  • IM3.P010
Using machine learning and topographic SEM imaging for software assisted fractography