Microscopy Conference 2023

Spectroscopic coincidence experiments at nanoseconds time resolution in TEM

IM 2: Spectroscopy

Aberration correctors, electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDX) are nowadays indispensable tools for obtaining atomic-scale information of chemical composition and bonding in materials. Not only can material phases be identified, but important effects such as interdiffusion between phases, or charge ordering, to name but a few, can be studied. In the past decade, in EELS low energy losses were intensively used to identify surface plasmons in nanomaterials, even in a tomographic approach. This was made possible by the implementation of electron monochromators into the electron gun. Recent technological advances have opened the energy-loss window into the sub-10 meV regime where a range of new phenomena can now be studied. These include phonons, low-energy plasmons, and possibly many more low-energy excitations in materials. The wealth of information generates new grand challenges in understanding and modelling the underlying fundamentals of signal generation and intelligent processing of large data sets. Contributions are invited on hardware and technique developments, theory and simulation, data processing as well as applications covering both physical and biological sciences.

Spectroscopy

Abstract talk

IM 1: Progress in instrumentation and ultrafast EM

Investigation of the impact of multiple plasmon-loss on low-angle electron diffraction by energy-filtered 4D-STEM

IM 5: Quantitative image and diffraction data analysis

Poster session IM 5: Quantitative image and diffraction data analysis

Poster

Characterisation of a timepix detector for use in SEM acceleration voltage range

IM 3: SEM and FIB developments

Poster session IM 3: SEM and FIB developments

IM 6: Phase-related techniques & 4D STEM

Integrated differential phase contrast (iDPC) STEM for ultimate low dose imaging at atomic resolution, including cryo nano particles

Poster session IM 6: Phase-related techniques & 4D STEM

IM 4: Development of cryo-EM instrumentation and techniques

Cryo-STEM imaging for single particle structure determination

Technological advances steadily push the limits of cryo-electron microscopy (cryo-EM). In recent years, novel developments in cryo-EM instrumentation as well as newly established workflows enabled groundbreaking insights in both, life sciences and material sciences.
In this session we will discuss new developments in experimental cryogenic techniques, cryo-sample preparation as well as instrumental capabilities applied across different fields.
Contributions are welcome from, but not restricted to, the following areas: SEM, FIB, TEM, STEM and CLEM at cryogenic temperatures, including hardware improvements, cryo-stages, cryogenic sample preparation techniques used for EM, measurements of local temperature as well as image processing for cryo-EM.


Development of cryo-EM instrumentation and techniques

LS 1: High-resolution cryo-EM

Adaptation of the wsirt algorithm for vector field tomography

Quantitative field mapping around electrically biased needles by STEM &amp; holography

Parametrized diffraction inversion by gradient-based optimization employing a fully differentiable multislice

Modern (direct electron) detectors and advanced data recording schemes have pushed the level to which images and diffraction patterns can be quantified, thus bringing experimental data closer to the realm of simulations and theory. At the same time, simulation methods are capable of handling larger atomic structures and include more experimental parameters; and also data reconstruction algorithms have advanced in speed, accuracy and flexibility, thus bringing theory closer to experimental reality. This session welcomes contributions that present the state-of-the-art in extracting quantitative insight/knowledge from image and diffraction data, but also advances in simulation tools.

Quantitative image and diffraction data analysis

Second moment STEM tomography

Including inelastic plasmon scattering in multislice simulations for STEM: a real space integration scheme

Shape sensitivity in momentum resolved STEM

Wirtinger Flow: the effect of different noise models for low-dose scanning electron transmission microscopy

Effect of multiple scattering and the ice thickness on the information transfer in cryo transmission electron microscopy

Poster session LS 1: High-resolution cryo-EM

This symposium is hosted by the DGE Young Microscopists working group (yDGE) and will cover topics especially interesting for young researchers. For this, we invited experts who will give insights on publication writing and career planning.
In addition, we want to offer students the opportunity to give a short talk on their work in front of their young colleagues, to gain presentation experience in a casual atmosphere and enhance the scientific exchange.
The newly founded working group DGE Young Microscopists will briefly introduce their activities and possibilities to join.
Our goal is a lively, relaxed exchange between students and early-career postdocs to connect to like-minded colleagues. For this, the symposium will be followed by a social event nearby the conference's venue.


DGE young microscopists symposium

Reciprocity based phase contrast in a conventional TEM setup

MS 5: Functional organic materials

Impact of dynamical scattering on first moment imaging of a ferroelectric PbZr0.2Ti0.8O3

MS 7: Ceramics and composites

Revealing the stacking configuration of ideal Moiré structures in CVD grown MoSe2-WSe2 heterobilayers

MS 3: Low-dimensional and quantum materials

Poster session MS 3: Low-dimensional and quantum materials

4D STEM – characterisation of materials and contrast enhancement in light matter

This session focusses on methods associated with different aspects of phase in electron microscopy. A first topic concerns mapping of the Coulomb potential, electric or magnetic fields, for instance using methods that retrieve the phase of the electron wave such as electron holography or focus variation reconstruction. The session also covers differential phase contrast (DPC) microscopy, which is based on the acquisition of a Ronchigram per scan position (4D-STEM) with a segmented, pixelated or other dedicated detector, using the first moment of the intensity distribution or a ptychographic reconstruction of the object phase. Another topic is related to the shaping of the phase of the electron wave using different kinds of phase plates, vortex beams, and beam shaping in general. Contributions may also tackle related theoretical topics, image simulation, influence of inelastic contributions and similar aspects.

Knut Müller-Caspary

Einsätze

02.03.2023