Microscopy Conference 2023

Aligned stacking of nanopatterned 2D materials for high-resolution 3D device fabrication

MS 3: Low-dimensional and quantum materials

Poster session MS 3: Low-dimensional and quantum materials

Poster

IM 3: SEM and FIB developments

Novel synthesis routes for nitrogen doped graphene and atomic level characterization

IM 5: Quantitative image and diffraction data analysis

Analyzing and assembling layered materials, atom by atom and layer by layer, in 2D and 3D

This session focuses on the development and application of advanced imaging, diffraction and spectroscopy to provide new insight into the structural, compositional and functional properties of low-dimensional and quantum materials. A specific focus will be placed on methods for imaging individual defects, enhancing the contrast of light atoms, preparing and cleaning ultra-thin samples, developing automated workflows for low dose imaging of beam sensitive materials and linking electron microscopy with complementary characterisation techniques. Other topics of interest include in situ experiments carried out at cryogenic or elevated temperature, as well as in the presence of external stimuli such as applied voltage, field, gases or light.

Jonas Haas

Einsätze

28.02.2023