Microscopy Conference 2023

Enhancing relative aberration measurements in the TEM by PCTF-corrected cross-correlation

IM 5: Quantitative image and diffraction data analysis

Poster session IM 5: Quantitative image and diffraction data analysis

Poster

IM 6: Phase-related techniques & 4D STEM

A post-column imaging energy filter compatible with multiple detectors

IM 2: Spectroscopy

Poster session IM 2: Spectroscopy

IM 1: Progress in instrumentation and ultrafast EM

Panta Rhei: a software platform for acquisition and processing of image and spectral data

Hexapole correctors for STEM: CESCOR, DCOR, ASCOR and beyond ...

This session will cover recent advancements of instrumentation for imaging and analytical purposes of transmission electron microscopy (TEM and STEM). Part of this session will focus on time-resolved electron microscopy and its various aspects to study optical excitations and nonequilibrium phenomena in materials. Contributions are welcome to describe the state of the art of instrumentation for high resolution imaging as well as all variants of analytical techniques.

Progress in instrumentation and ultrafast EM

Abstract talk

Aberration correctors for cryo electron microscopy

LS 1: High-resolution cryo-EM

Poster session LS 1: High-resolution cryo-EM

IM 4: Development of cryo-EM instrumentation and techniques

A semiconductor-type segmented STEM annular dark-field detector

poster session 2

Poster presentations

poster session 9

Martin Linck

Einsätze

27.02.2023

28.02.2023