Microscopy Conference 2023

Event-driven MHz 4D STEM for low dose and in situ electron microscopy

IMLB: Late breaking abstracts

Late breaking posters IM

Poster

IM 1: Progress in instrumentation and ultrafast EM

Magnetic phase imaging using Lorentz near-field electron ptychography

IM 6: Phase-related techniques & 4D STEM

Poster session IM 6: Phase-related techniques & 4D STEM

IM 5: Quantitative image and diffraction data analysis

Dynamic range compression in iDPC imaging enables visualisation of light atoms closely surrounded by heavy elements

Poster session IM 5: Quantitative image and diffraction data analysis

Structured illumination electron ptychography: probe design and experimental implementation

This session focusses on methods associated with different aspects of phase in electron microscopy. A first topic concerns mapping of the Coulomb potential, electric or magnetic fields, for instance using methods that retrieve the phase of the electron wave such as electron holography or focus variation reconstruction. The session also covers differential phase contrast (DPC) microscopy, which is based on the acquisition of a Ronchigram per scan position (4D-STEM) with a segmented, pixelated or other dedicated detector, using the first moment of the intensity distribution or a ptychographic reconstruction of the object phase. Another topic is related to the shaping of the phase of the electron wave using different kinds of phase plates, vortex beams, and beam shaping in general. Contributions may also tackle related theoretical topics, image simulation, influence of inelastic contributions and similar aspects.

Phase-related techniques & 4D STEM

Abstract talk

Shape sensitivity in momentum resolved STEM

Probing atomic tilt coupling in oxide superlattices Pr0.7Ca0.3MnO3/SrRuO3 using quantitative electron microscopy

Penghan Lu

Einsätze

28.02.2023

01.03.2023

02.03.2023