Microscopy Conference 2023

Beyond conventional chemical mapping: prospects and challenges of orbital mapping

IM 2: Spectroscopy

Aberration correctors, electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDX) are nowadays indispensable tools for obtaining atomic-scale information of chemical composition and bonding in materials. Not only can material phases be identified, but important effects such as interdiffusion between phases, or charge ordering, to name but a few, can be studied. In the past decade, in EELS low energy losses were intensively used to identify surface plasmons in nanomaterials, even in a tomographic approach. This was made possible by the implementation of electron monochromators into the electron gun. Recent technological advances have opened the energy-loss window into the sub-10 meV regime where a range of new phenomena can now be studied. These include phonons, low-energy plasmons, and possibly many more low-energy excitations in materials. The wealth of information generates new grand challenges in understanding and modelling the underlying fundamentals of signal generation and intelligent processing of large data sets. Contributions are invited on hardware and technique developments, theory and simulation, data processing as well as applications covering both physical and biological sciences.

Spectroscopy

Abstract talk

IM 5: Quantitative image and diffraction data analysis

Spatially localized electronic states at the LaAlO<sub>3</sub>/TiO<sub>2</sub> interface: mapping of a 2D electron gas

MS 4: Functional thin films

This session focusses on functional thin films and advanced structured materials targeted for applications in a wide range of energy and information technologies, including intriguing physical effects at interfaces of epitaxial complex oxide systems, electron and ion conductors, photovoltaics, thermo-electrics, dielectrics, and resistive switching. The optimization of these devices, from materials’ design to applications, requires a thorough knowledge of the structural, physical, and chemical properties, its interactions with the environment and the role of interfacial effects, for which recent technical innovations in electron microscopy hardware and software have provided a fertile ground for their analysis with unprecedented spatial and spectral resolution. We welcome contributions to latest developments at the forefront of scientific achievements and impact in the design, synthesis, characterization, and applications of functional thin films.

Functional thin films

MS 7: Ceramics and composites

Michael Oberaigner

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