Microscopy Conference 2023

Parametrized diffraction inversion by gradient-based optimization employing a fully differentiable multislice

IM 5: Quantitative image and diffraction data analysis

Modern (direct electron) detectors and advanced data recording schemes have pushed the level to which images and diffraction patterns can be quantified, thus bringing experimental data closer to the realm of simulations and theory. At the same time, simulation methods are capable of handling larger atomic structures and include more experimental parameters; and also data reconstruction algorithms have advanced in speed, accuracy and flexibility, thus bringing theory closer to experimental reality. This session welcomes contributions that present the state-of-the-art in extracting quantitative insight/knowledge from image and diffraction data, but also advances in simulation tools.

Quantitative image and diffraction data analysis

Abstract talk

IM 6: Phase-related techniques & 4D STEM

Second moment STEM tomography

Poster session IM 5: Quantitative image and diffraction data analysis

Poster

4D STEM – characterisation of materials and contrast enhancement in light matter

This session focusses on methods associated with different aspects of phase in electron microscopy. A first topic concerns mapping of the Coulomb potential, electric or magnetic fields, for instance using methods that retrieve the phase of the electron wave such as electron holography or focus variation reconstruction. The session also covers differential phase contrast (DPC) microscopy, which is based on the acquisition of a Ronchigram per scan position (4D-STEM) with a segmented, pixelated or other dedicated detector, using the first moment of the intensity distribution or a ptychographic reconstruction of the object phase. Another topic is related to the shaping of the phase of the electron wave using different kinds of phase plates, vortex beams, and beam shaping in general. Contributions may also tackle related theoretical topics, image simulation, influence of inelastic contributions and similar aspects.

Phase-related techniques & 4D STEM

Invited talk

Revealing the stacking configuration of ideal Moiré structures in CVD grown MoSe<sub>2</sub>-WSe<sub>2</sub> heterobilayers

MS 3: Low-dimensional and quantum materials

Poster session MS 3: Low-dimensional and quantum materials

aurum

Instrumentation and methods

Benedikt Diederichs

Vortrag

Weitere Beteiligungen