Microscopy Conference 2023

Enabling In situ TEM biasing of Two-terminal Oxide-based Nanodevices using MEMS-based chips and gas cells

IM 7: In situ/operando electron microscopy

Nowadays, in situ/operando electron microscopy is a rapidly growing field due to the implementation of nanotechnology towards the fabrication of greatly improved, stable and more flexible sample holders. Furthermore, data collection, analysis and recording of dynamic information is becoming increasingly faster. Recent advances include, for example, the use of microelectromechanical systems (MEMS) based chips for in situ transmission electron microscopy. The capability to perform multiple measurements while simultaneously analysing corresponding structural, chemical, or even electronic structure changes in functional and nano- materials at different length scales are opening exciting new opportunities at the forefront of modern materials science research. This symposium intends to review progress on in situ/operando TEM and SEM experiments that apply heating, cooling, electrical biasing, and mechanical testing to induce and probe phase transformations.

In situ/operando electron microscopy

Abstract talk

IM 3: SEM and FIB developments

High resolution and analytical transmission electron microscopy in a liquid flow cell via gas purging

Poster session IM 7: In situ/operando electron microscopy

Poster

MS 1: Energy-related materials and catalysts

<em>In-situ</em> liquid phase transmission electron microscopy as a disruptive tool for life science applications

LS 5: Correlative and multimodal microscopy

poster session 8

Poster presentations

Yevheniy Pivak

Vortrag

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