Microscopy Conference 2023

Probing 3D reciprocal space of textured nanocrystalline thin films using electron diffraction tomography

IM 5: Quantitative image and diffraction data analysis

Modern (direct electron) detectors and advanced data recording schemes have pushed the level to which images and diffraction patterns can be quantified, thus bringing experimental data closer to the realm of simulations and theory. At the same time, simulation methods are capable of handling larger atomic structures and include more experimental parameters; and also data reconstruction algorithms have advanced in speed, accuracy and flexibility, thus bringing theory closer to experimental reality. This session welcomes contributions that present the state-of-the-art in extracting quantitative insight/knowledge from image and diffraction data, but also advances in simulation tools.

Quantitative image and diffraction data analysis

Abstract talk

MS 5: Functional organic materials

Design of lattice-matched AuxNi1-x(111)/α-Al2O3(0001) interfaces and their investigation by X-ray diffraction and electron microscopy

Tobias Unruh

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