Microscopy Conference 2023

Interference gating: a novel way for the dynamic investigation of switching semiconductor nanostructures by time-resolved electron holography

IM 1: Progress in instrumentation and ultrafast EM

This session will cover recent advancements of instrumentation for imaging and analytical purposes of transmission electron microscopy (TEM and STEM). Part of this session will focus on time-resolved electron microscopy and its various aspects to study optical excitations and nonequilibrium phenomena in materials. Contributions are welcome to describe the state of the art of instrumentation for high resolution imaging as well as all variants of analytical techniques.

Progress in instrumentation and ultrafast EM

Abstract talk

IM 6: Phase-related techniques & 4D STEM

Towards quantitative measurements of electric fields in TEM: a synergy of electrical biasing STEBIC and off-axis electron holography

Poster session IM 6: Phase-related techniques & 4D STEM

Poster

IM 7: In situ/operando electron microscopy

Dirk Berger

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