Microscopy Conference 2023

Interference gating: a novel way for the dynamic investigation of switching semiconductor nanostructures by time-resolved electron holography

IM 1: Progress in instrumentation and ultrafast EM

This session will cover recent advancements of instrumentation for imaging and analytical purposes of transmission electron microscopy (TEM and STEM). Part of this session will focus on time-resolved electron microscopy and its various aspects to study optical excitations and nonequilibrium phenomena in materials. Contributions are welcome to describe the state of the art of instrumentation for high resolution imaging as well as all variants of analytical techniques.

Ines Häusler

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