Microscopy Conference 2023

Spectroscopic coincidence experiments at nanoseconds time resolution in TEM

IM 2: Spectroscopy

Aberration correctors, electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDX) are nowadays indispensable tools for obtaining atomic-scale information of chemical composition and bonding in materials. Not only can material phases be identified, but important effects such as interdiffusion between phases, or charge ordering, to name but a few, can be studied. In the past decade, in EELS low energy losses were intensively used to identify surface plasmons in nanomaterials, even in a tomographic approach. This was made possible by the implementation of electron monochromators into the electron gun. Recent technological advances have opened the energy-loss window into the sub-10 meV regime where a range of new phenomena can now be studied. These include phonons, low-energy plasmons, and possibly many more low-energy excitations in materials. The wealth of information generates new grand challenges in understanding and modelling the underlying fundamentals of signal generation and intelligent processing of large data sets. Contributions are invited on hardware and technique developments, theory and simulation, data processing as well as applications covering both physical and biological sciences.

Spectroscopy

Abstract talk

IM 1: Progress in instrumentation and ultrafast EM

Can we enhance the depth of focus/depth resolution in STEM with an electrostatic phase plate?

IM 6: Phase-related techniques & 4D STEM

This session focusses on methods associated with different aspects of phase in electron microscopy. A first topic concerns mapping of the Coulomb potential, electric or magnetic fields, for instance using methods that retrieve the phase of the electron wave such as electron holography or focus variation reconstruction. The session also covers differential phase contrast (DPC) microscopy, which is based on the acquisition of a Ronchigram per scan position (4D-STEM) with a segmented, pixelated or other dedicated detector, using the first moment of the intensity distribution or a ptychographic reconstruction of the object phase. Another topic is related to the shaping of the phase of the electron wave using different kinds of phase plates, vortex beams, and beam shaping in general. Contributions may also tackle related theoretical topics, image simulation, influence of inelastic contributions and similar aspects.

Phase-related techniques & 4D STEM

Adaptive probe correction with electrostatic phase plate

Poster session IM 1: Progress in instrumentation and ultrafast EM

Poster

This symposium is hosted by the DGE Young Microscopists working group (yDGE) and will cover topics especially interesting for young researchers. For this, we invited experts who will give insights on publication writing and career planning.
In addition, we want to offer students the opportunity to give a short talk on their work in front of their young colleagues, to gain presentation experience in a casual atmosphere and enhance the scientific exchange.
The newly founded working group DGE Young Microscopists will briefly introduce their activities and possibilities to join.
Our goal is a lively, relaxed exchange between students and early-career postdocs to connect to like-minded colleagues. For this, the symposium will be followed by a social event nearby the conference's venue.


DGE young microscopists symposium

Evaluation a 48 pixel programmable phase plate for electron wavefront shaping

This session will cover recent advancements of instrumentation for imaging and analytical purposes of transmission electron microscopy (TEM and STEM). Part of this session will focus on time-resolved electron microscopy and its various aspects to study optical excitations and nonequilibrium phenomena in materials. Contributions are welcome to describe the state of the art of instrumentation for high resolution imaging as well as all variants of analytical techniques.

Progress in instrumentation and ultrafast EM

Secondary electron imaging in scanning transmission electron microscopy for material science

IM 7: In situ/operando electron microscopy

A diffusion model for electron beam damage in STEM

IM 5: Quantitative image and diffraction data analysis

Armand Béché

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