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Abstract Talk
AT 041

High-resolution x-ray diffraction and 4D nanobeam diffraction analyses of cubic and hexagonal GaN films on MgF2 grown by MBE

Termin

Datum: 11.10.2022

Zeit: 09:00 – 09:15

Redezeit: 12 Min.

Diskussionszeit: 3 Min.

Ort / Stream:

Room Berlin

Session

Structural Characterization, Growth model-1

Themen

Characterization
Growth

Mitwirkende

Kevin Meyer (Institute of Energy Research and Physical Technologies IEPT, TU Clausthal / DE), Tobias Westphal (4th Institute of Physics - Solids and Nanostructures, University of Goettingen / DE), Christoph Flathmann (4th Institute of Physics - Solids and Nanostructures, University of Goettingen / DE), Dr. Tobias Meyer (Institute of Material Physics, University of Goettingen / DE), Prof. Dr. Michael Seibt (4th Institute of Physics - Solids and Nanostructures, University of Goettingen / DE), Prof. Dr. Daniel Schaadt (Institute of Energy Research and Physical Technologies IEPT, TU Clausthal / DE)