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Evaluation and processing of Si/Ge-doped free-standing Ga and N-terminated c-plane wurtzite GaN surface quality

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Topic Characterization

Session

Characterization

Themen

  • Characterization
  • Novel Materials and Nanostructures

Mitwirkende

Mohammadreza Rostami (Technical university of Munich / DE), Dr. Biao Yang (Technical university of Munich / DE), Dr. Felix Haag (Technical university of Munich / DE), Pablo Vezzoni (Technical university of Munich / DE), Dr. Francesco Allegretti (Technical university of Munich / DE), Professor Lifeng Chi (Institute of Functional Nano & Soft Materials, Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow / CN), Professor Martin Stutzmann (Walter Schottky Institute, Technical University of Munich / DE), Professor Johannes Barth (Technical university of Munich / DE)

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