28 February 2023
TESCAN TENSOR: The integrated, precession-assisted, analytical 4D-STEM
Latest developments in EM sample preparation
Overview of our latest developments in the field of cryo-FIB
Bruker's new generation of standard and annular EDS detectors complementing a variety of analytical tools for electron microscopy
Precession enhanced electron diffraction applications in TEM for nanomaterials studies
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