Description
Following on the increasing demand from the Semiconductor market for high-volume & short cycle-time TEM & STEM Metrology and Physical Failure Analysis, Thermo Scientific has recently released its new Talos F200E solution. Within this lunchtime lecture, we will detail further on how much the new Talos F200E can help Lab Managers and Failure Analysis Specialists to achieve well-calibrated and reliable high-throughput and high-performance data acquisition and processing, and on how the New Talos F200E X-CFEG and Dual-X features can help to significantly improve the STEM analytical power and preserve their customer’s sample integrity.