Abstract text (incl. figure legends and references)
Correlative microscopy has become an essential tool helping us understand the complexity of the sample properties. It combines different imaging systems and benefits for understanding the principles of materials. Correlation of atomic force microscopy (AFM) and complementary technique, scanning electron microscopy (SEM), has several advantages, such as multimodal analyses under in-situ conditions, with precise localization to the area of interest.
With the ever-increasing number of battery-powered devices around us, the importance of optimizing our means of energy storage grows. Therefore, getting to know how the processes in batteries work in nanoscale is crucial. Cathode Active Materials, such as LiNiO2, are the core ingredient of a battery. These micro-particle powders have their grains coated to prevent unwanted chemical reactions but conserve high conductivity. The result is a rechargeable battery with a longer lifetime.
To be able to measure such powders, we used AFM-in-SEM, LiteScope, to image the conductivity and the topography of such coated particles. Since the powdered cathode material prone to immediate oxidation upon air exposure, it is a very difficult sample for separate AFM and SEM systems and needs to be analyzed in-situ. The correlated data in 3D conductive AFM and CPEM view (Correlative Probe and Electron Microscopy) show surprisingly complex coating structure, see fig. 1.
Thus, the AFM-in-SEM solution allows us analyses under in-situ conditions of several AFM modes – such as 3D topography, electrical, magnetic, or mechanical properties – and SEM capabilities like fast imaging, chemical analysis, or surface modification. This way, the Correlative Microscopy is essential not only in battery research, but also in other fields of Material science, Nanotechnology, Life science, and other areas in both research and industry.
Fig. 1: Correlative analysis of LiNiO2 cathode powder: SEM provided fast navigation, elemental analysis (EDX) and material contrast. AFM provided 3D topography and conductivity mapping. The 3D CPEM view merged AFM topography and SEM signal.