Abstract text (incl. figure legends and references)
Introduction
According to EMDB and PDB data bases the number of data entries (solved structures) in the last 10 years (2011 – 2021) has been grown almost in an exponential manner by 23-fold. This is an enormous increase which is a result of several advances in cryo electron microscopy technology. Camera models with higher sensitivity and speed, more robust and user-friendly cryo transmission electron microscopes (cryo TEM), refined sample preparation tools and constantly improving analysis software paved the way to this development.
ObjectivesRecent developments and achievements with the CRYO ARMTM series from JEOL will be presented along selected application examples.
Materials & methodsJEOL is one of the largest manufacturers of electron microscopes worldwide and from early on contributed to the current success in the field of cryo electron microscopy. Since the early 1980th JEOL has released the 8th generation of cryo TEM"s the CRYO ARMTM series. Basically, two version are available comprising unique features like a cold field emission source which was pioneered by the CRYO ARM series for the cryo electron microscopy community as well as in-column energy filters and outstanding resolution performance without sophisticated and expensive add-ons like correctors and monochromators.
ResultsHigher throughput in terms of moves per hour were achieved by more efficient data collections routines and microscope alignments. Multi images per hole routines together with "Koehler mode" set up resulted in > 500 images per hour depending on the detector used. New direct detector camera generations were evaluated and gave rise to high resolution data sets for tomography, single particle (SPA) and MicroED applications.
ConclusionAll together these data demonstrate the high flexibility and robustness of the latest generation CRYO ARMTM II series for the needs of current and future applications in the field of structural biology.