Microscopy Conference 2023

Enabling In situ TEM biasing of Two-terminal Oxide-based Nanodevices using MEMS-based chips and gas cells

IM 7: In situ/operando electron microscopy

Nowadays, in situ/operando electron microscopy is a rapidly growing field due to the implementation of nanotechnology towards the fabrication of greatly improved, stable and more flexible sample holders. Furthermore, data collection, analysis and recording of dynamic information is becoming increasingly faster. Recent advances include, for example, the use of microelectromechanical systems (MEMS) based chips for in situ transmission electron microscopy. The capability to perform multiple measurements while simultaneously analysing corresponding structural, chemical, or even electronic structure changes in functional and nano- materials at different length scales are opening exciting new opportunities at the forefront of modern materials science research. This symposium intends to review progress on in situ/operando TEM and SEM experiments that apply heating, cooling, electrical biasing, and mechanical testing to induce and probe phase transformations.

In situ/operando electron microscopy

Abstract talk

IM 3: SEM and FIB developments

Insight into the atomic structure and misfit relaxation mechanisms in micrometer-thick SrMoO3 oxide electrodes grown on scandate substrates

MS 4: Functional thin films

Poster session MS 4: Functional thin films

Poster

IM 5: Quantitative image and diffraction data analysis

Revealing the nanostructure of filamentary HfO2-based memristors by scanning precession electron diffraction (SPED)

IM 6: Phase-related techniques & 4D STEM

Diffusion processes in HfO2-based memristors investigated by in situ STEM and atom probe tomography

Oscar Recalde-Benitez

Speaker

Further involvements