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Ting Luo

Düsseldorf / DE

Max-Planck-Institut für Eisenforschung

Further involvements

28/02/2023
Poster
MS4.P006
Diffusion processes in HfO₂-based memristors investigated by in situ STEM and atom probe tomography
IM 7: In situ/operando electron microscopy, MS 4: Functional thin films