Microscopy Conference 2023

Revealing the stacking configuration of ideal Moiré structures in CVD grown MoSe<sub>2</sub>-WSe<sub>2</sub> heterobilayers

MS 3: Low-dimensional and quantum materials

Poster session MS 3: Low-dimensional and quantum materials

Poster

IM 6: Phase-related techniques & 4D STEM

Second moment STEM tomography

IM 5: Quantitative image and diffraction data analysis

Poster session IM 5: Quantitative image and diffraction data analysis

Parametrized diffraction inversion by gradient-based optimization employing a fully differentiable multislice

Modern (direct electron) detectors and advanced data recording schemes have pushed the level to which images and diffraction patterns can be quantified, thus bringing experimental data closer to the realm of simulations and theory. At the same time, simulation methods are capable of handling larger atomic structures and include more experimental parameters; and also data reconstruction algorithms have advanced in speed, accuracy and flexibility, thus bringing theory closer to experimental reality. This session welcomes contributions that present the state-of-the-art in extracting quantitative insight/knowledge from image and diffraction data, but also advances in simulation tools.

Quantitative image and diffraction data analysis

Abstract talk

Lea Richter

Further involvements