Microscopy Conference 2023

FIB-notch: a novel method towards ultra-high throughput TEM sample preparation

IM 3: SEM and FIB developments

This session dial with new developments in SEM and FIB technology and methods. Especially new detector principals and designs for electrons, ions and photons locally emitted after interaction with different types of ion or electron beams. Techniques using the angular distribution of the scattered ions and electrons like EBSD and ECCI will be covered by the contributions. New strategies in beam control and data analysis will also be discussed.

SEM and FIB developments

Abstract talk

Workshop 2: Tricks and pitfalls for FIB sample preparation in materials and life sciences

Microstructure-functionality relationships of pulsed laser deposited CuI thin films

MS 4: Functional thin films

This session focusses on functional thin films and advanced structured materials targeted for applications in a wide range of energy and information technologies, including intriguing physical effects at interfaces of epitaxial complex oxide systems, electron and ion conductors, photovoltaics, thermo-electrics, dielectrics, and resistive switching. The optimization of these devices, from materials’ design to applications, requires a thorough knowledge of the structural, physical, and chemical properties, its interactions with the environment and the role of interfacial effects, for which recent technical innovations in electron microscopy hardware and software have provided a fertile ground for their analysis with unprecedented spatial and spectral resolution. We welcome contributions to latest developments at the forefront of scientific achievements and impact in the design, synthesis, characterization, and applications of functional thin films.

Functional thin films

MS 2: Metals and alloys

aurum

Instrumentation and methods

Richard Busch

Speaker

Further involvements