Microscopy Conference 2023

Parametrized diffraction inversion by gradient-based optimization employing a fully differentiable multislice

IM 5: Quantitative image and diffraction data analysis

Modern (direct electron) detectors and advanced data recording schemes have pushed the level to which images and diffraction patterns can be quantified, thus bringing experimental data closer to the realm of simulations and theory. At the same time, simulation methods are capable of handling larger atomic structures and include more experimental parameters; and also data reconstruction algorithms have advanced in speed, accuracy and flexibility, thus bringing theory closer to experimental reality. This session welcomes contributions that present the state-of-the-art in extracting quantitative insight/knowledge from image and diffraction data, but also advances in simulation tools.

Quantitative image and diffraction data analysis

Abstract talk

IM 6: Phase-related techniques & 4D STEM

Wirtinger Flow: the effect of different noise models for low-dose scanning electron transmission microscopy

Poster session IM 6: Phase-related techniques & 4D STEM

Poster

LS 1: High-resolution cryo-EM

Frank Filbir

Further involvements