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MC 2023
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Jean Felix Dushimineza
Jülich / DE
Forschungszentrum Jülich GmbH
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28/02/2023
Poster
IM5.P0018
Quantitative field mapping around electrically biased needles by STEM & holography
IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
Further involvements
28/02/2023
Poster
IM5.P0018
Quantitative field mapping around electrically biased needles by STEM & holography
IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
02/03/2023
11:00
–
11:30
25 Min.
5 Min.
Invited talk
IM6.002-invited
4D STEM – characterisation of materials and contrast enhancement in light matter
IM 6: Phase-related techniques & 4D STEM
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