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MC 2023
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DE
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Martin Linck
Heidelberg / DE
CEOS GmbH
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27/02/2023
Poster
LS1.P003
Aberration correctors for cryo electron microscopy
IM 4: Development of cryo-EM instrumentation and techniques, LS 1: High-resolution cryo-EM
28/02/2023
Poster
IM5.P008
Enhancing relative aberration measurements in the TEM by PCTF-corrected cross-correlation
IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
Further involvements
27/02/2023
12:00
–
12:15
10 Min.
5 Min.
Abstract talk
IM1.006
Hexapole correctors for STEM: CESCOR, DCOR, ASCOR and beyond ...
IM 1: Progress in instrumentation and ultrafast EM, IM 6: Phase-related techniques & 4D STEM
27/02/2023
Poster
IM2.P007
A post-column imaging energy filter compatible with multiple detectors
IM 1: Progress in instrumentation and ultrafast EM, IM 2: Spectroscopy
27/02/2023
Poster
IM2.P008
Panta Rhei: a software platform for acquisition and processing of image and spectral data
IM 2: Spectroscopy, IM 5: Quantitative image and diffraction data analysis
27/02/2023
Poster
LS1.P003
Aberration correctors for cryo electron microscopy
IM 4: Development of cryo-EM instrumentation and techniques, LS 1: High-resolution cryo-EM
28/02/2023
Poster
IM5.P008
Enhancing relative aberration measurements in the TEM by PCTF-corrected cross-correlation
IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
28/02/2023
Poster
IM5.P0011
A semiconductor-type segmented STEM annular dark-field detector
IM 1: Progress in instrumentation and ultrafast EM, IM 5: Quantitative image and diffraction data analysis
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