Microscopy Conference 2023

Mapping local phonon modes in silicon grain boundaries at atomic resolution

IM 2: Spectroscopy

Aberration correctors, electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDX) are nowadays indispensable tools for obtaining atomic-scale information of chemical composition and bonding in materials. Not only can material phases be identified, but important effects such as interdiffusion between phases, or charge ordering, to name but a few, can be studied. In the past decade, in EELS low energy losses were intensively used to identify surface plasmons in nanomaterials, even in a tomographic approach. This was made possible by the implementation of electron monochromators into the electron gun. Recent technological advances have opened the energy-loss window into the sub-10 meV regime where a range of new phenomena can now be studied. These include phonons, low-energy plasmons, and possibly many more low-energy excitations in materials. The wealth of information generates new grand challenges in understanding and modelling the underlying fundamentals of signal generation and intelligent processing of large data sets. Contributions are invited on hardware and technique developments, theory and simulation, data processing as well as applications covering both physical and biological sciences.

Spectroscopy

Abstract talk

MS 3: Low-dimensional and quantum materials

Advances in ptychography with a focus on low-dose and 3D applications

IM 5: Quantitative image and diffraction data analysis

Modern (direct electron) detectors and advanced data recording schemes have pushed the level to which images and diffraction patterns can be quantified, thus bringing experimental data closer to the realm of simulations and theory. At the same time, simulation methods are capable of handling larger atomic structures and include more experimental parameters; and also data reconstruction algorithms have advanced in speed, accuracy and flexibility, thus bringing theory closer to experimental reality. This session welcomes contributions that present the state-of-the-art in extracting quantitative insight/knowledge from image and diffraction data, but also advances in simulation tools.

Quantitative image and diffraction data analysis

Invited talk

LS 4: Image analysis of large data sets

Measurement of electron dose in TEM mode at a JEOL TEM/STEM JEM 2200FS

Poster session IM 5: Quantitative image and diffraction data analysis

Poster

IM 1: Progress in instrumentation and ultrafast EM

Mechanisms for radiation damage in biological specimens revealed by vibrational EELS

IM 4: Development of cryo-EM instrumentation and techniques

Technological advances steadily push the limits of cryo-electron microscopy (cryo-EM). In recent years, novel developments in cryo-EM instrumentation as well as newly established workflows enabled groundbreaking insights in both, life sciences and material sciences.
In this session we will discuss new developments in experimental cryogenic techniques, cryo-sample preparation as well as instrumental capabilities applied across different fields.
Contributions are welcome from, but not restricted to, the following areas: SEM, FIB, TEM, STEM and CLEM at cryogenic temperatures, including hardware improvements, cryo-stages, cryogenic sample preparation techniques used for EM, measurements of local temperature as well as image processing for cryo-EM.


Development of cryo-EM instrumentation and techniques

Characterisation of doped graphene with focal-series reconstruction

Poster session MS 3: Low-dimensional and quantum materials

IM 6: Phase-related techniques & 4D STEM

Change of basis: a compression method for ptychography

This symposium is hosted by the DGE Young Microscopists working group (yDGE) and will cover topics especially interesting for young researchers. For this, we invited experts who will give insights on publication writing and career planning.
In addition, we want to offer students the opportunity to give a short talk on their work in front of their young colleagues, to gain presentation experience in a casual atmosphere and enhance the scientific exchange.
The newly founded working group DGE Young Microscopists will briefly introduce their activities and possibilities to join.
Our goal is a lively, relaxed exchange between students and early-career postdocs to connect to like-minded colleagues. For this, the symposium will be followed by a social event nearby the conference's venue.


DGE young microscopists symposium

Data processing workflows with nextflow and a ptychography use case

Workshop 1: Data management

Poster session WS 1: Data management

Spatially-resolved properties of twisted 2D TMDs

Playground 4D-STEM in SEMs: a rich toolbox for a wide range of applications

Poster session IM 6: Phase-related techniques & 4D STEM

IM 3: SEM and FIB developments

poster session 9

Poster presentations

Session chairs

Modern microscopes are capable of quickly producing terabytes of multidimensional and multimodal data in form of (correlated) images, spectra, diffraction patterns. While managing and (online) processing such large amounts of data may require some investment in computer hard- and software, the even bigger challenge lies in the effective utilization of such data, often in an international team. Ultimately, the paradigm of FAIR (findable, accessible, interoperable, and re-purposable) data aims at data re-utilization by others, potentially with completely different research questions in mind. 
This session welcomes contributions describing solutions that enable handling and processing of big data in microscopy, but also solutions that make microscopy data FAIR.  An important aspect here, is the (automated) annotation of the experimental data by relevant metadata that is both human and machine readable. In addition, this session shall provide room for the demonstration of examples where FAIR research data management helps to lower the threshold for sharing data with collaborators and the scientific community and as such enabling synergistic combining of data from various sources or techniques. 


Christoph T. Koch

Chair

Further involvements