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MC 2023
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Rudolpho Hötzel
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Date
Further involvements
02/03/2023
11:30
–
11:45
10 Min.
5 Min.
Abstract talk
IM6.003
Electrical fields in AlN/GaN-nanowires measured with aberration-corrected 4D-STEM
IM 5: Quantitative image and diffraction data analysis, IM 6: Phase-related techniques & 4D STEM
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