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MC 2023
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DE
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Daen Jannis
Antwerp / BE
University of Antwerp
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Date
Speaker
27/02/2023
Poster
IM1.P005
A diffusion model for electron beam damage in STEM
IM 1: Progress in instrumentation and ultrafast EM, IM 5: Quantitative image and diffraction data analysis
28/02/2023
11:30
–
11:45
10 Min.
5 Min.
Abstract talk
IM2.003
Spectroscopic coincidence experiments at nanoseconds time resolution in TEM
IM 1: Progress in instrumentation and ultrafast EM, IM 2: Spectroscopy
Further involvements
27/02/2023
Poster
IM1.P003
Low voltage transmission electron diffraction in SEM as a powerful tool for wide field of view characterization of crystalline materials
IM 1: Progress in instrumentation and ultrafast EM, IM 5: Quantitative image and diffraction data analysis
27/02/2023
Poster
IM1.P005
A diffusion model for electron beam damage in STEM
IM 1: Progress in instrumentation and ultrafast EM, IM 5: Quantitative image and diffraction data analysis
28/02/2023
11:30
–
11:45
10 Min.
5 Min.
Abstract talk
IM2.003
Spectroscopic coincidence experiments at nanoseconds time resolution in TEM
IM 1: Progress in instrumentation and ultrafast EM, IM 2: Spectroscopy
28/02/2023
Poster
IM3.P001
Characterisation of a timepix detector for use in SEM acceleration voltage range
IM 3: SEM and FIB developments, IM 6: Phase-related techniques & 4D STEM
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