Microscopy Conference 2023

Cryo focussed ion beam secondary ion mass spectrometry analysis of Galinstan

IM 3: SEM and FIB developments

This session dial with new developments in SEM and FIB technology and methods. Especially new detector principals and designs for electrons, ions and photons locally emitted after interaction with different types of ion or electron beams. Techniques using the angular distribution of the scattered ions and electrons like EBSD and ECCI will be covered by the contributions. New strategies in beam control and data analysis will also be discussed.

SEM and FIB developments

Abstract talk

IM 4: Development of cryo-EM instrumentation and techniques

FIB ToF-SIMS and EDS analysis of LLZO garnet electrolyte for solid-state batteries

MS 1: Energy-related materials and catalysts

Poster session MS 1: Energy-related materials and catalysts

Poster

Lukas Berner

Further involvements