Microscopy Conference 2023

Probing 3D reciprocal space of textured nanocrystalline thin films using electron diffraction tomography

IM 5: Quantitative image and diffraction data analysis

Modern (direct electron) detectors and advanced data recording schemes have pushed the level to which images and diffraction patterns can be quantified, thus bringing experimental data closer to the realm of simulations and theory. At the same time, simulation methods are capable of handling larger atomic structures and include more experimental parameters; and also data reconstruction algorithms have advanced in speed, accuracy and flexibility, thus bringing theory closer to experimental reality. This session welcomes contributions that present the state-of-the-art in extracting quantitative insight/knowledge from image and diffraction data, but also advances in simulation tools.

Quantitative image and diffraction data analysis

Abstract talk

MS 5: Functional organic materials

Seeing structural evolution of organic molecular nano-crystallites using 4D-scanning confocal electron diffraction (4D-SCED)

MS 4: Functional thin films

This session focusses on functional thin films and advanced structured materials targeted for applications in a wide range of energy and information technologies, including intriguing physical effects at interfaces of epitaxial complex oxide systems, electron and ion conductors, photovoltaics, thermo-electrics, dielectrics, and resistive switching. The optimization of these devices, from materials’ design to applications, requires a thorough knowledge of the structural, physical, and chemical properties, its interactions with the environment and the role of interfacial effects, for which recent technical innovations in electron microscopy hardware and software have provided a fertile ground for their analysis with unprecedented spatial and spectral resolution. We welcome contributions to latest developments at the forefront of scientific achievements and impact in the design, synthesis, characterization, and applications of functional thin films.

Functional thin films

IM 6: Phase-related techniques & 4D STEM

Twist enables superlubric behavior in bilayer graphene

IMLB: Late breaking abstracts

Late breaking posters IM

Poster

IM 7: In situ/operando electron microscopy

Ordering of scandium into monolayers of aluminium nitride and its implication for AlScN based nitride semiconductor devices

Poster session MS 4: Functional thin films

MS 1: Energy-related materials and catalysts

Hexagonal hybrid bismuthene by molecular interface engineering

MS 3: Low-dimensional and quantum materials

This session focuses on the development and application of advanced imaging, diffraction and spectroscopy to provide new insight into the structural, compositional and functional properties of low-dimensional and quantum materials. A specific focus will be placed on methods for imaging individual defects, enhancing the contrast of light atoms, preparing and cleaning ultra-thin samples, developing automated workflows for low dose imaging of beam sensitive materials and linking electron microscopy with complementary characterisation techniques. Other topics of interest include in situ experiments carried out at cryogenic or elevated temperature, as well as in the presence of external stimuli such as applied voltage, field, gases or light.

Low-dimensional and quantum materials

spectrum A

Materials science

Mingjian Wu

Speaker

Further involvements