Microscopy Conference 2023

New principle and robot for vitrification of cryo-EM samples with controllable sample thickness and real-time optical inspection

IM 4: Development of cryo-EM instrumentation and techniques

Technological advances steadily push the limits of cryo-electron microscopy (cryo-EM). In recent years, novel developments in cryo-EM instrumentation as well as newly established workflows enabled groundbreaking insights in both, life sciences and material sciences.
In this session we will discuss new developments in experimental cryogenic techniques, cryo-sample preparation as well as instrumental capabilities applied across different fields.
Contributions are welcome from, but not restricted to, the following areas: SEM, FIB, TEM, STEM and CLEM at cryogenic temperatures, including hardware improvements, cryo-stages, cryogenic sample preparation techniques used for EM, measurements of local temperature as well as image processing for cryo-EM.


Abraham J. Koster

Further involvements