Microscopy Conference 2023

Simultaneous acquisition of real and reciprocal space information in transmission SEM

IM 3: SEM and FIB developments

This session dial with new developments in SEM and FIB technology and methods. Especially new detector principals and designs for electrons, ions and photons locally emitted after interaction with different types of ion or electron beams. Techniques using the angular distribution of the scattered ions and electrons like EBSD and ECCI will be covered by the contributions. New strategies in beam control and data analysis will also be discussed.

SEM and FIB developments

Abstract talk

IM 1: Progress in instrumentation and ultrafast EM

Investigation of the underlying mechanism of the Ag-induced layer exchange by <em>in situ</em> studies in SEM and TEM

IM 7: In situ/operando electron microscopy

Nowadays, in situ/operando electron microscopy is a rapidly growing field due to the implementation of nanotechnology towards the fabrication of greatly improved, stable and more flexible sample holders. Furthermore, data collection, analysis and recording of dynamic information is becoming increasingly faster. Recent advances include, for example, the use of microelectromechanical systems (MEMS) based chips for in situ transmission electron microscopy. The capability to perform multiple measurements while simultaneously analysing corresponding structural, chemical, or even electronic structure changes in functional and nano- materials at different length scales are opening exciting new opportunities at the forefront of modern materials science research. This symposium intends to review progress on in situ/operando TEM and SEM experiments that apply heating, cooling, electrical biasing, and mechanical testing to induce and probe phase transformations.

In situ/operando electron microscopy

Correlative <em>in situ</em> light and electron microscopy studies on the deformation behavior of silver nanowires on polymer substrates

Peter Denninger

Speaker

Further involvements