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Tobias Vogel

Further involvements

28/02/2023
Poster
MS4.P006
Diffusion processes in HfO₂-based memristors investigated by in situ STEM and atom probe tomography
IM 7: In situ/operando electron microscopy, MS 4: Functional thin films
28/02/2023
Poster
MS4.P008
Revealing the nanostructure of filamentary HfO2-based memristors by scanning precession electron diffraction (SPED)
IM 6: Phase-related techniques & 4D STEM, MS 4: Functional thin films