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Shogo Koshiya

Akishima / JP

JEOL Ltd.

Further involvements

27/02/2023
Poster
MS1.P011
Improvement of SEM-SXES analysis for beam sensitive materials by using cooling stage
IM 7: In situ/operando electron microscopy, MS 1: Energy-related materials and catalysts
01/03/2023
Poster
IM7.P015
Observation of chemical state changes during sample cooling using a soft X-ray emission spectrometer
IM 2: Spectroscopy, IM 7: In situ/operando electron microscopy