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MC 2023
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DE
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Lambert Alff
Darmstadt / DE
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Further involvements
28/02/2023
Poster
MS4.P003
Extended grain boundary structures in quasi-epitaxial TiN
1-x
electrode thin films grown on
c
-Al
2
O
3
MS 2: Metals and alloys, MS 4: Functional thin films
28/02/2023
Poster
MS4.P006
Diffusion processes in HfO
2
-based memristors investigated by
in situ
STEM and atom probe tomography
IM 7: In situ/operando electron microscopy, MS 4: Functional thin films
28/02/2023
Poster
MS4.P008
Revealing the nanostructure of filamentary HfO2-based memristors by scanning precession electron diffraction (SPED)
IM 6: Phase-related techniques & 4D STEM, MS 4: Functional thin films
28/02/2023
Poster
MS4.P011
Insight into the atomic structure and misfit relaxation mechanisms in micrometer-thick SrMoO
3
oxide electrodes grown on scandate substrates
IM 5: Quantitative image and diffraction data analysis, MS 4: Functional thin films
02/03/2023
15:45
–
16:00
10 Min.
5 Min.
Abstract talk
IM7.007
Enabling In situ TEM biasing of Two-terminal Oxide-based Nanodevices using MEMS-based chips and gas cells
IM 3: SEM and FIB developments, IM 7: In situ/operando electron microscopy
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