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Detailed microstructural analysis of defects in 25mm thick GaN homo-epitaxial layers and varying substrates

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Topic Characterization

Session

Characterization

Topics

  • Characterization
  • Growth

Authors

Dr. Nadeemullah Mahadik (Naval Research Laboratory / US), Dr. Jaime Freita Jr. (Naval Research Laboratory / US), Dr. James Gallagher (Naval Research Laboratory / US), Dr. Robert Stahlbush (Naval Research Laboratory / US), Dr. Brendan Gunning (Sandia Nationl Laboratory / US), Dr. Robert Kaplar (Sandia Nationl Laboratory / US), Dr. Travis Anderson (Naval Research Laboratory / US)

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