.css-1xsl8rf{width:100%;display:-webkit-box;display:-webkit-flex;display:-ms-flexbox;display:flex;-webkit-align-items:center;-webkit-box-align:center;-ms-flex-align:center;align-items:center;position:relative;overflow:hidden;background:var(--alert-bg);-webkit-padding-start:var(--chakra-space-4);padding-inline-start:var(--chakra-space-4);-webkit-padding-end:var(--chakra-space-4);padding-inline-end:var(--chakra-space-4);padding-top:var(--chakra-space-1);padding-bottom:var(--chakra-space-1);--alert-fg:var(--chakra-colors-orange-600);--alert-bg:var(--chakra-colors-orange-100);font-weight:var(--chakra-fontWeights-semibold);padding-left:var(--chakra-space-4);}.chakra-ui-dark .css-1xsl8rf:not([data-theme]),[data-theme=dark] .css-1xsl8rf:not([data-theme]),.css-1xsl8rf[data-theme=dark]{--alert-fg:var(--chakra-colors-orange-200);--alert-bg:rgba(251, 211, 141, 0.16);}@media screen and (min-width: 48em){.css-1xsl8rf{padding-left:var(--chakra-space-8);}}Please enable Javascript to use all features and improve your user experience.

Mikołaj Żak

Polish Academy of Sciences / PL

Polish Academy of Sciences

Speaker

12/10/2022
Poster Presentation
PP 395
Red to blue wavelength-tunable light emitting diode
Novel Materials and Nanostructures, Optical devices

Further involvements

11/10/2022
17:15 – 17:30 12 Min. 3 Min.
Abstract Talk
AT 102
Probing of carrier diffusion length in III-nitride micro-light emitting diodes
Characterization, Optical devices
12/10/2022
Poster Presentation
PP 393
High temperature growth of InGaN in plasma assisted molecular beam epitaxy – a path towards improvement of quantum efficiency
Growth, Optical devices
12/10/2022
Poster Presentation
PP 395
Red to blue wavelength-tunable light emitting diode
Novel Materials and Nanostructures, Optical devices
12/10/2022
15:15 – 15:30 12 Min. 3 Min.
Abstract Talk
AT 155
Electrochemical etching of p-type GaN
Characterization, Novel Materials and Nanostructures
12/10/2022
15:15 – 15:30 12 Min. 3 Min.
Abstract Talk
AT 163
Blue laser diodes with nanoporous bottom cladding – device fabrication and properties
Characterization, Optical devices