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IWN 2022
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Dr. Ben Hourahine
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Date
Further involvements
10/10/2022
13:45
–
14:00
12 Min.
3 Min.
Abstract Talk
AT 004
Correlative light-electron microscopy – non-destructive imaging of residual strains and their effect on optical and electrical properties of III-Nitrides
Characterization, Growth
11/10/2022
Poster Presentation
PP 214
Observation of novel orientations in an AlN thin film grown on m-plane sapphire using electron backscatter diffraction
Characterization, Growth
12/10/2022
Poster Presentation
PP 314
Quantitative dislocation analysis of GaN in the scanning electron microscope
Characterization, Optical devices
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