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  • Poster Self-Study
  • P-38

In-operando material characterization with synchrotron x-ray scattering

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Patterend and (hierarchically) structured materials

Poster

In-operando material characterization with synchrotron x-ray scattering

Topic

  • Patterend and (hierarchically) structured materials

Authors

Oliver Christian Späker (Potsdam / DE; Dresden / DE), Laura Zorzetto (Potsdam / DE), Wolfgang Wagermaier (Potsdam / DE)

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